TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Freudenberger, Jürgen
A1  - Rajab, Mohammed
A1  - Shavgulidze, Sergo
T1  - Estimation of channel state information for non-volatile flash memories
T2  - 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin), 3-6 Sept. 2017, Berlin, Germany
N2  - Error correction coding based on soft-input decoding can significantly improve the reliability of flash memories. Such soft-input decoding algorithms require reliability information about the state of the memory cell. This work proposes a channel model for soft-input decoding that considers the asymmetric error characteristic of multi-level cell (MLC) and triple-level cell (TLC) memories. Based on this model, an estimation method for the channel state information is devised which avoids additional pilot data for channel estimation. Furthermore, the proposed method supports page-wise read operations.
KW  - Channel estimation
KW  - Decoding
KW  - Error correction codes
KW  - Flash memories
KW  - Integrated circuit reliability
Y1  - 2017
SN  - 978-1-5090-4015-5
SB  - 978-1-5090-4015-5
SN  - 978-1-5090-4014-8
SB  - 978-1-5090-4014-8
U6  - https://doi.org/10.1109/ICCE-Berlin.2017.8210594
DO  - https://doi.org/10.1109/ICCE-Berlin.2017.8210594
N1  - Volltextzugriff für Hochschulangehörige via Datenbank IEEE Xplore
SP  - 69
EP  - 73
PB  - IEEE
ER  -