TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Giones, Ferran
A1  - Miralles, Francesc
A1  - König, Marc
A1  - Baltes, Guido H.
T1  - Do all paths lead to Rome? Technology and market orientation influence on the growth of new technology-based firms
T2  - 2015 IEEE International Conference on Engineering, Technology and Innovation/ International Technology Management Conference (ICE/ITMC), 22-24 Juny 2015, Belfast, UK
N2  - Technology commercialization is described as the most dreadful challenge for technology-based entrepreneurs. The scarcity of resources and limited managerial experience make it a daunting task, putting in danger the whole firm emergence. Prior research has often build upon the resource-based view to propose that the new firms' performance is dependent on their initial resource endowments and configurations. Nevertheless, little is known on how the early-stage decisions of the entrepreneur might influence on the growth of the firm. Scholars have suggested that both technology and market orientation actions could influence the performance and growth of firms in this context; nevertheless, there is limited empirical evidence of the influence of these different orientations in the context of new technology-based firms (NTBFs). In this study we propose to explore the influence of technology and demand creation actions adopting a demand-side view. We use a longitudinal study on a panel dataset (2004-2007) with 249 U.S. new high-technology firms to test our hypothesis. The results point towards a rather limited influence of initial resource configurations, as well as an unexpected influence of market and technology orientation in the growth dimensions of an NTBF. The research holds implications for the management of new technology-based firms and for those interested in supporting the development of technology entrepreneurship.
KW  - technology management
KW  - innovation management
KW  - organisational aspects
Y1  - 2015
U6  - https://doi.org/10.1109/ICE.2015.7438660
DO  - https://doi.org/10.1109/ICE.2015.7438660
N1  - Volltextzugriff für Hochschulangehörige via Datenbank IEEE Xplore
SP  - 1
EP  - 8
ER  -