TY  - CHAP
A1  - Ahrens, Tobias
A1  - Rajab, Mohammed
A1  - Freudenberger, Jürgen
T1  - Compression of short data blocks to improve the reliability of non-volatile flash memories
T2  - International Conference on Information and Digital Technologies (IDT), 5-7 July 2016, Rzeszów, Poland
N2  - This work investigates data compression algorithms for applications in non-volatile flash memories. The main goal of the data compression is to minimize the amount of user data such that the redundancy of the error correction coding can be increased and the reliability of the error correction can be improved. A compression algorithm is proposed that combines a modified move-to-front algorithm with Huffman coding. The proposed data compression algorithm has low complexity, but provides a compression gain comparable to the Lempel-Ziv-Welch algorithm.
KW  - Redundancy
KW  - Data compression
KW  - Error correction
KW  - Flash memories
KW  - Huffman codes
Y1  - 2016
SN  - 978-1-4673-8861-0
U6  - http://dx.doi.org/10.1109/DT.2016.7557141
N1  - Volltextzugriff für Angehörige der Hochschule Konstanz via Datenbank IEEE Xplore möglich.
SP  - 1
EP  - 4
PB  - IEEE
ER  - 
TY  - CHAP
A1  - Freudenberger, Jürgen
A1  - Beck, Alexander
A1  - Rajab, Mohammed
T1  - A data compression scheme for reliable data storage in non-volatile memories
T2  - IEEE 5th International Conference on Consumer Electronics - Berlin, (ICCE-Berlin), 6-9 Sept. 2015
N2  - This contribution presents a data compression scheme for applications in non-volatile flash memories. The objective of the data compression algorithm is to reduce the amount of user data such that the redundancy of the error correction coding can be increased in order to improve the reliability of the data storage system. The data compression is performed on block level considering data blocks of 1 kilobyte. We present an encoder architecture that has low memory requirements and provides a fast data encoding.
KW  - Redundancy
KW  - Data compression
KW  - Error correction codes
KW  - Flash memories
Y1  - 2015
SN  - 978-1-4799-8748-1
SN  - 978-1-4799-8749-8
U6  - http://dx.doi.org/10.1109/ICCE-Berlin.2015.7391216
N1  - Volltextzugriff für Hochschulangehörige via Datenbank IEEE Xplore
SP  - 139
EP  - 142
ER  -