Open Access

Daniel Nicolas Bailon, Guillaume Taburet, Sergo Shavgulidze, Jürgen Freudenberger

• Large persistent memory is crucial for many applications in embedded systems and automotive computing like AI databases, ADAS, and cutting-edge infotainment systems. Such applications require reliable NAND flash memories made for harsh automotive conditions. However, due to high memory densities and production tolerances, the error probability of NAND flash memories has risen. As the number of program/erase cycles and the data retention times increase, non-volatile NAND flash memories' performance and dependability suffer. The read reference voltages of the flash cells vary due to these aging processes. In this work, we consider the issue of reference voltage adaption. The considered estimation procedure uses shallow neural networks to estimate the read reference voltages for different life-cycle conditions with the help of histogram measurements. We demonstrate that the training data for the neural networks can be enhanced by using shifted histograms, i.e., a training of the neural networks is possible based on a few measurements of some extreme points used as training data. The trained neural networks generalize well for other life-cycle conditions.