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Ein Beitrag zum Beobachterentwurf und zur sensorlosen Folgeregelung translatorischer Magnetaktoren
(2020)
Pascal Laube presents machine learning approaches for three key problems of reverse engineering of defective structured surfaces: parametrization of curves and surfaces, geometric primitive classification and inpainting of high-resolution textures. The proposed methods aim to improve the reconstruction quality while further automating the process. The contributions demonstrate that machine learning can be a viable part of the CAD reverse engineering pipeline.
In this thesis, the recognition problem and the properties of eigenvalues and eigenvectors of matrices which are strictly sign-regular of a given order, i.e., matrices whose minors of a given order have the same strict sign, are considered. The results are extended to matrices which are sign-regular of a given order, i.e., matrices whose minors of a given order have the same sign or are allowed to vanish. As a generalization, a new type of matrices called oscillatory of a specific order, are introduced. Furthermore, the properties for this type are investigated. Also, same applications to dynamic systems are given.
NAND flash memory is widely used for data storage due to low power consumption, high throughput, short random access latency, and high density. The storage density of the NAND flash memory devices increases from one generation to the next, albeit at the expense of storage reliability.
Our objective in this dissertation is to improve the reliability of the NAND flash memory with a low hard implementation cost. We investigate the error characteristic, i.e. the various noises of the NAND flash memory. Based on the error behavior at different life-aging stages, we develop offset calibration techniques that minimize the bit error rate (BER).
Furthermore, we introduce data compression to reduce the write amplification effect and support the error correction codes (ECC) unit. In the first scenario, the numerical results show that the data compression can reduce the wear-out by minimizing the amount of data that is written to the flash. In the ECC scenario, the compression gain is used to improve the ECC capability. Based on the first scenario, the write amplification effect can be halved for the considered target flash and data model. By combining the ECC and data compression, the NAND flash memory lifetime improves three fold compared with uncompressed data for the same data model.
In order to improve the data reliability of the NAND flash memory, we investigate different ECC schemes based on concatenated codes like product codes, half-product codes, and generalized concatenated codes (GCC). We propose a construction for high-rate GCC for hard-input decoding. ECC based on soft-input decoding can significantly improve the reliability of NAND flash memories. Therefore, we propose a low-complexity soft-input decoding algorithm for high-rate GCC.