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The introduction of multiple-level cell (MLC) and triple-level cell (TLC) technologies reduced the reliability of flash memories significantly compared with single-level cell flash. With MLC and TLC flash cells, the error probability varies for the different states. Hence, asymmetric models are required to characterize the flash channel, e.g., the binary asymmetric channel (BAC). This contribution presents a combined channel and source coding approach improving the reliability of MLC and TLC flash memories. With flash memories data compression has to be performed on block level considering short-data blocks. We present a coding scheme suitable for blocks of 1 kB of data. The objective of the data compression algorithm is to reduce the amount of user data such that the redundancy of the error correction coding can be increased in order to improve the reliability of the data storage system. Moreover, data compression can be utilized to exploit the asymmetry of the channel to reduce the error probability. With redundant data, the proposed combined coding scheme results in a significant improvement of the program/erase cycling endurance and the data retention time of flash memories.
Generalized concatenated (GC) codes with soft-input decoding were recently proposed for error correction in flash memories. This work proposes a soft-input decoder for GC codes that is based on a low-complexity bit-flipping procedure. This bit-flipping decoder uses a fixed number of test patterns and an algebraic decoder for soft-input decoding. An acceptance criterion for the final candidate codeword is proposed. Combined with error and erasure decoding of the outer Reed-Solomon codes, this bit-flipping decoder can improve the decoding performance and reduce the decoding complexity compared to the previously proposed sequential decoding. The bit-flipping decoder achieves a decoding performance similar to a maximum likelihood decoder for the inner codes.
This work proposes a construction for low-density parity-check (LDPC) codes over finite Gaussian integer fields. Furthermore, a new channel model for codes over Gaussian integers is introduced and its channel capacity is derived. This channel can be considered as a first order approximation of the additive white Gaussian noise channel with hard decision detection where only errors to nearest neighbors in the signal constellation are considered. For this channel, the proposed LDPC codes can be decoded with a simple non-probabilistic iterative decoding algorithm similar to Gallager's decoding algorithm A.
The binary asymmetric channel (BAC) is a model for the error characterization of multi-level cell (MLC) flash memories. This contribution presents a joint channel and source coding approach improving the reliability of MLC flash memories. The objective of the data compression algorithm is to reduce the amount of user data such that the redundancy of the error correction coding can be increased in order to improve the reliability of the data storage system. Moreover, data compression can be utilized to exploit the asymmetry of the channel to reduce the error probability. With MLC flash memories data compression has to be performed on block level considering short data blocks. We present a coding scheme suitable for blocks of 1 kilobyte of data.
Error correction coding based on soft-input decoding can significantly improve the reliability of flash memories. Such soft-input decoding algorithms require reliability information about the state of the memory cell. This work proposes a channel model for soft-input decoding that considers the asymmetric error characteristic of multi-level cell (MLC) and triple-level cell (TLC) memories. Based on this model, an estimation method for the channel state information is devised which avoids additional pilot data for channel estimation. Furthermore, the proposed method supports page-wise read operations.
In this article, we give the construction of new four-dimensional signal constellations in the Euclidean space, which represent a certain combination of binary frequency-shift keying (BFSK) and M-ary amplitude-phase-shift keying (MAPSK). Description of such signals and the formulas for calculating the minimum squared Euclidean distance are presented. We have developed an analytic building method for even and odd values of M. Hence, no computer search and no heuristic methods are required. The new optimized BFSK-MAPSK (M = 5,6,···,16) signal constructions are built for the values of modulation indexes h =0.1,0.15,···,0.5 and their parameters are given. The results of computer simulations are also provided. Based on the obtained results we can conclude, that BFSK-MAPSK systems outperform similar four-dimensional systems both in terms of minimum squared Euclidean distance and simulated symbol error rate.
Side Channel Attack Resistance of the Elliptic Curve Point Multiplication using Eisenstein Integers
(2020)
Asymmetric cryptography empowers secure key exchange and digital signatures for message authentication. Nevertheless, consumer electronics and embedded systems often rely on symmetric cryptosystems because asymmetric cryptosystems are computationally intensive. Besides, implementations of cryptosystems are prone to side-channel attacks (SCA). Consequently, the secure and efficient implementation of asymmetric cryptography on resource-constrained systems is demanding. In this work, elliptic curve cryptography is considered. A new concept for an SCA resistant calculation of the elliptic curve point multiplication over Eisenstein integers is presented and an efficient arithmetic over Eisenstein integers is proposed. Representing the key by Eisenstein integer expansions is beneficial to reduce the computational complexity and the memory requirements of an SCA protected implementation.
The reliability of flash memories suffers from various error causes. Program/erase cycles, read disturb, and cell to cell interference impact the threshold voltages and cause bit errors during the read process. Hence, error correction is required to ensure reliable data storage. In this work, we investigate the bit-labeling of triple level cell (TLC) memories. This labeling determines the page capacities and the latency of the read process. The page capacity defines the redundancy that is required for error correction coding. Typically, Gray codes are used to encode the cell state such that the codes of adjacent states differ in a single digit. These Gray codes minimize the latency for random access reads but cannot balance the page capacities. Based on measured voltage distributions, we investigate the page capacities and propose a labeling that provides a better rate balancing than Gray labeling.
Soft-input decoding of concatenated codes based on the Plotkin construction and BCH component codes
(2020)
Low latency communication requires soft-input decoding of binary block codes with small to medium block lengths.
In this work, we consider generalized multiple concatenated (GMC) codes based on the Plotkin construction. These codes are similar to Reed-Muller (RM) codes. In contrast to RM codes, BCH codes are employed as component codes. This leads to improved code parameters. Moreover, a decoding algorithm is proposed that exploits the recursive structure of the concatenation. This algorithm enables efficient soft-input decoding of binary block codes with small to medium lengths. The proposed codes and their decoding achieve significant performance gains compared with RM codes and recursive GMC decoding.