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Automotive computing applications like AI databases, ADAS, and advanced infotainment systems have a huge need for persistent memory. This trend requires NAND flash memories designed for extreme automotive environments. However, the error probability of NAND flash memories has increased in recent years due to higher memory density and production tolerances. Hence, strong error correction coding is needed to meet automotive storage requirements. Many errors can be corrected by soft decoding algorithms. However, soft decoding is very resource-intensive and should be avoided when possible. NAND flash memories are organized in pages, and the error correction codes are usually encoded page-wise to reduce the latency of random reads. This page-wise encoding does not reach the maximum achievable capacity. Reading soft information increases the channel capacity but at the cost of higher latency and power consumption. In this work, we consider cell-wise encoding, which also increases the capacity compared to page-wise encoding. We analyze the cell-wise processing of data in triple-level cell (TLC) NAND flash and show the performance gain when using Low-Density Parity-Check (LDPC) codes. In addition, we investigate a coding approach with page-wise encoding and cell-wise reading.
Large persistent memory is crucial for many applications in embedded systems and automotive computing like AI databases, ADAS, and cutting-edge infotainment systems. Such applications require reliable NAND flash memories made for harsh automotive conditions. However, due to high memory densities and production tolerances, the error probability of NAND flash memories has risen. As the number of program/erase cycles and the data retention times increase, non-volatile NAND flash memories' performance and dependability suffer. The read reference voltages of the flash cells vary due to these aging processes. In this work, we consider the issue of reference voltage adaption. The considered estimation procedure uses shallow neural networks to estimate the read reference voltages for different life-cycle conditions with the help of histogram measurements. We demonstrate that the training data for the neural networks can be enhanced by using shifted histograms, i.e., a training of the neural networks is possible based on a few measurements of some extreme points used as training data. The trained neural networks generalize well for other life-cycle conditions.