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The introduction of multiple-level cell (MLC) and triple-level cell (TLC) technologies reduced the reliability of flash memories significantly compared with single-level cell flash. With MLC and TLC flash cells, the error probability varies for the different states. Hence, asymmetric models are required to characterize the flash channel, e.g., the binary asymmetric channel (BAC). This contribution presents a combined channel and source coding approach improving the reliability of MLC and TLC flash memories. With flash memories data compression has to be performed on block level considering short-data blocks. We present a coding scheme suitable for blocks of 1 kB of data. The objective of the data compression algorithm is to reduce the amount of user data such that the redundancy of the error correction coding can be increased in order to improve the reliability of the data storage system. Moreover, data compression can be utilized to exploit the asymmetry of the channel to reduce the error probability. With redundant data, the proposed combined coding scheme results in a significant improvement of the program/erase cycling endurance and the data retention time of flash memories.
Error correction coding based on soft-input decoding can significantly improve the reliability of non-volatile flash memories. This work proposes a soft-input decoder for generalized concatenated (GC) codes. GC codes are well suited for error correction in flash memories for high reliability data storage. We propose GC codes constructed from inner extended binary Bose-Chaudhuri-Hocquenghem (BCH) codes and outer Reed-Solomon codes. The extended BCH codes enable an efficient hard-input decoding. Furthermore, a low-complexity soft-input decoding method is proposed. This bit-flipping decoder uses a fixed number of test patterns and an algebraic decoder for soft-decoding. An acceptance criterion for the final candidate codeword is proposed. Combined with error and erasure decoding of the outer Reed-Solomon codes, this acceptance criterion can improve the decoding performance and reduce the decoding complexity. The presented simulation results show that the proposed bit-flipping decoder in combination with outer error and erasure decoding can outperform maximum likelihood decoding of the inner codes.