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Bayesian Calibration of MEMS Accelerometers

  • This study aims to investigate the utilization of Bayesian techniques for the calibration of micro-electro-mechanical system (MEMS) accelerometers. These devices have garnered substantial interest in various practical applications and typically require calibration through error-correcting functions. The parameters of these error-correcting functions are determined during a calibration process. However, due to various sources of noise, these parameters cannot be determined with precision, making it desirable to incorporate uncertainty in the calibration models. Bayesian modeling offers a natural and complete way of reflecting uncertainty by treating the model parameters as variables rather than fixed values. In addition, Bayesian modeling enables the incorporation of prior knowledge, making it an ideal choice for calibration. Nevertheless, it is infrequently used in sensor calibration. This study introduces Bayesian methods for the calibration of MEMS accelerometer data in a straightforward manner using recent advances in probabilistic programming.

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Metadaten
Author:Oliver DürrORCiDGND, Po-Yu Fan, Zong-Xian YinORCiD
DOI:https://doi.org/10.1109/JSEN.2023.3272907
ISSN:1530-437X
eISSN:1558-1748
Parent Title (English):IEEE Sensors Journal
Volume:23
Publisher:Institute of Electrical and Electronics Engineers (IEEE)
Document Type:Article
Language:English
Year of Publication:2023
Release Date:2023/06/28
Tag:Accelerometer calibration; Bayesian parameter estimation; Gravity-based in-field calibration; Inertial measurement unit (IMU); Low-cost IMU calibration; Markov chain Monte Carlo (MCMC); Micro-electro-mechanical systems (MEMSs); Multiposition calibration; Uncertainty
Issue:12
Page Number:8
First Page:13319
Last Page:13326
Relevance:Peer reviewed Publikation in Master Journal List
Open Access?:Nein
Licence (German):License LogoUrheberrechtlich geschützt