Read Reference Calibration and Tracking for Non-Volatile Flash Memories
- The performance and reliability of non-volatile NAND flash memories deteriorate as the number of program/erase cycles grows. The reliability also suffers from cell to cell interference, long data retention time, and read disturb. These processes effect the read threshold voltages. The aging of the cells causes voltage shifts which lead to high bit error rates (BER) with fixed pre-defined read thresholds. This work proposes two methods that aim on minimizing the BER by adjusting the read thresholds. Both methods utilize the number of errors detected in the codeword of an error correction code. It is demonstrated that the observed number of errors is a good measure for the voltage shifts and is utilized for the initial calibration of the read thresholds. The second approach is a gradual channel estimation method that utilizes the asymmetrical error probabilities for the one-to-zero and zero-to-one errors that are caused by threshold calibration errors. Both methods are investigated utilizing the mutual information between the optimal read voltage and the measured error values. Numerical results obtained from flash measurements show that these methods reduce the BER of NAND flash memories significantly.
Author: | Johann-Philipp ThiersORCiD, Daniel Nicolas BailonORCiD, Jürgen FreudenbergerORCiDGND, Jianjie Lu |
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URN: | urn:nbn:de:bsz:kon4-opus4-29779 |
DOI: | https://doi.org/10.3390/electronics10182306 |
ISSN: | 2079-9292 |
Parent Title (English): | Electronics |
Volume: | 10 |
Publisher: | MDPI |
Place of publication: | Basel |
Document Type: | Article |
Language: | English |
Year of Publication: | 2021 |
Release Date: | 2022/01/10 |
Tag: | Nonvolatile NAND flash; Program/erase cycles; Data retention time; Channel estimation; Threshold calibration |
Issue: | 18 |
Page Number: | 17 |
Article Number: | 2306 |
Note: | Corresponding author: Jürgen Freudenberger |
Institutes: | Institut für Systemdynamik - ISD |
Open Access?: | Ja |
Relevance: | Peer reviewed Publikation in Master Journal List |
Licence (German): | Creative Commons - CC BY - Namensnennung 4.0 International |